Method and apparatus for testing a circuit using a die frame...

Details Method and apparatus for testing a circuit using a die frame... Method and apparatus for testing a circuit using a die frame...

2006-08-08

2006-08-08

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S039000

Reexamination Certificate

active

07089473

ABSTRACT:
A die frame logic analyzer unit. For one aspect, a programmable logic analyzer unit is provided, wherein at least a first portion of the programmable logic analyzer unit is provided in a die frame. The programmable logic analyzer unit is to test a function of an integrated circuit on a wafer that includes the die frame.

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