Method and apparatus for measuring test coverage

Details Method and apparatus for measuring test coverage Method and apparatus for measuring test coverage

2007-12-11

2007-12-11

Lin, Sun James (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

11252019

ABSTRACT:
A method, computer program product, and data processing system for determining test sequences' coverage of events in testing a semiconductor design are disclosed. Test patterns are randomly generated by one or more “frontend” computers. Results from applying these patterns to the design under test are transmitted to a “backend” computer in the form of an ordered dictionary of events and bitmap and/or countmap data structures. A “bitmap” data structure encodes Boolean information regarding whether or not a given event was covered by a particular test sequence. A “countmap” data structure includes frequency information indicating how many times a given event was triggered by a particular test sequence. The backend computer combines results from each test sequence in a cumulative fashion to measure the overall coverage of the set of test sequences.

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