4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

David Dolezal

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Method and apparatus for measuring test coverage

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for performing test pattern autograding

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method for speeding up serial data tolerance testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate

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System and method for circuit symbolic timing analysis of...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Vendor independent method to merge coverage results for...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2184340

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