4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

Amol V. Bhinge

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Method and apparatus for measuring test coverage

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for performing test pattern autograding

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Vendor independent method to merge coverage results for...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2184339

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