Method and apparatus for manipulating a sample

Details Method and apparatus for manipulating a sample Method and apparatus for manipulating a sample

2006-05-09

2006-05-09

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07040147

ABSTRACT:
A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.

REFERENCES:
patent: 5343042 (1994-08-01), Fuchs et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5504338 (1996-04-01), Marrian et al.
patent: 5831181 (1998-11-01), Majumdar et al.

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