4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Ami Chand

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Method and apparatus for manipulating a sample

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Method and apparatus for manipulating a sample

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Method of forming semiconductor devices in wafer assembly

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Methods of fabricating structures for characterizing tip...

Measuring and testing – Instrument proving or calibrating – Roughness or hardness
Reexamination Certificate

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Methods of fabricating structures for characterizing tip...

Measuring and testing – Instrument proving or calibrating – Roughness or hardness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-1949453

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