4. Radiant energy
  5. With charged particle beam deflection or focussing
  6. With target means

Veeco Instruments Inc.

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Active probe for an atomic force microscope and method for...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Active probe for an atomic force microscope and method of...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Adaptive controller for ion source

Data processing: generic control systems or specific application – Specific application – apparatus or process – Electrical power generation or distribution system
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Alignment and correction template for optical profilometric...

Optics: measuring and testing – By light interference – For dimensional measurement
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Alignment of magnetic heads for automatic identification of...

Optics: measuring and testing – By light interference – For dimensional measurement
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