Method and apparatus for improving gap-fill capability using che

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438697, 438699, 438734, H01L 21306

Patent

active

059900008

ABSTRACT:
A method and an apparatus for depositing a dielectric layer to fill in a gap between adjacent metal lines. In preferred embodiments of the method, a first dielectric layer is deposited over the lines and subsequently etched using both chemical and physical etchback steps. After the etchback steps are completed, a second dielectric layer is deposited over the first dielectric layer to fill in the gap.

REFERENCES:
patent: 4732658 (1988-03-01), Lee
patent: 5013400 (1991-05-01), Kurasaki et al.
patent: 5204288 (1993-04-01), Marks et al.
patent: 5270264 (1993-12-01), Andideh et al.
patent: 5296092 (1994-03-01), Kim
patent: 5354715 (1994-10-01), Wang et al.
patent: 5514624 (1996-05-01), Morozumi
patent: 5575886 (1996-11-01), Murase
patent: 5698467 (1997-12-01), Sakao et al.
patent: 5721172 (1998-02-01), Jang et al.
patent: 5841196 (1998-11-01), Gupta et al.
Laxman, Ravi, "Low E deo;ectrocs: CVD Fluorinated Silicon Dioxides", Semiconductor international, pp. 71, 72, 74, May 1995.
Wolf, Stanley, Silicon processing for the VLSI Era, vol. 1, p. 552, 1996.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for improving gap-fill capability using che does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for improving gap-fill capability using che, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for improving gap-fill capability using che will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1221413

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.