Method and apparatus for generating a local scan enable...

Details Method and apparatus for generating a local scan enable... Method and apparatus for generating a local scan enable...

2007-09-04

2007-09-04

Lamarre, Guy (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000, C714S731000

Reexamination Certificate

active

10819520

ABSTRACT:
An apparatus for providing a local scan enable signal. The local scan enable signal being used to perform an at-speed test on a portion of circuitry associated with the local scan enable signal. The local scan enable signal is generated from a global scan enable signal and clock signal. The global scan enable signal and clock signal are received from the system and used to generate a local scan enable signal to test each portion of circuitry in the die at speed.

REFERENCES:
patent: 5898702 (1999-04-01), Narayanan et al.
patent: 6442722 (2002-08-01), Nadeau-Dostie et al.
patent: 6990076 (2006-01-01), McNamara et al.
patent: 2002/0162064 (2002-10-01), Shimizu
patent: 2003/0115524 (2003-06-01), Johnston et al.
patent: 2004/0153926 (2004-08-01), Abdel-Hafez et al.
patent: 2004/0268181 (2004-12-01), Wang et al.

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