Method and apparatus for forming thin film of metal

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S610000, C148S220000, C427S226000, C427S250000

Reexamination Certificate

active

06972256

ABSTRACT:
The present invention relates to a method of and an apparatus for forming a thin metal film of copper, silver, or the like on a surface of a semiconductor or another substrate. A method of forming a thin metal film, comprises preparing a dispersed liquid having a metal-containing organic compound dispersed in a predetermined solvent, coating the dispersed liquid on a surface of a substrate and evaporating the solvent to form a coating layer, and applying an energy beam to the coating layer to decompose away an organic substance contained in the coating layer in an area irradiated with the energy beam and bond metal contained in the coating layer.According to the present invention, it is possible to form a thin metal film of good quality efficiently and stably. The thin metal film used as metal interconnects in highly integrated semiconductor circuits contributes to the progress of a process of fabricating semiconductor devices.

REFERENCES:
patent: 5966580 (1999-10-01), Watanabe et al.
patent: 5993701 (1999-11-01), Ando et al.
patent: 6358611 (2002-03-01), Nagasawa et al.
patent: 6517642 (2003-02-01), Horie et al.
patent: 51-123582 (1976-10-01), None
patent: 03-132035 (1991-06-01), None
patent: 04-157727 (1992-05-01), None

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