4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Koichi Karasaki

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Component alignment method

Radiant energy – Luminophor irradiation
Patent

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Method and apparatus for detecting a circuit pattern

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for detecting wiring patterns

Radiant energy – Luminophor irradiation
Patent

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Method and apparatus for inspecting printed wiring boards

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and apparatus for inspecting printed wiring boards

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Profile ID: LFUS-PAI-P-130578

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