Method and apparatus for calibrating a test system for an...

Details Method and apparatus for calibrating a test system for an... Method and apparatus for calibrating a test system for an...

2007-04-17

2007-04-17

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S744000

Reexamination Certificate

active

10139835

ABSTRACT:
A method and an apparatus provides for calibrating a test system for an integrated semiconductor circuit, a pattern generator of the test system generating a test signal in the form of a pattern of successive rising and falling edges, which is composed of superposed sub-patterns formed via different internal paths of the pattern generator. The pattern generator provides an information signal for a measuring device of the test system, which identifies the edges of at least one sub-pattern of the test signal with regard to their origin from one of the internal paths. The calibration is carried out for the internal path separately using the information signal.

REFERENCES:
patent: 4928278 (1990-05-01), Otsuji et al.
patent: 5502397 (1996-03-01), Buchanan
patent: 6005731 (1999-12-01), Foland et al.
patent: 6006349 (1999-12-01), Fujisaki
patent: 6021515 (2000-02-01), Shimura
patent: 6105157 (2000-08-01), Miller
Wikipedia Online Encyclopedia. Flip-flop. http://en.wikipedia.org/wiki/Flip-flop.
Abramovici, Miron, Melvin A. Breuer, and Arthur D. Friedman. Digital Systems Testing and Testable Design. Piscataway, NJ: IEEE Press Marketing, 1990.
Kikuchi et al., “A Gate-Array-Based 666MHz VLSI Test System”, International Test Conference, pp. 451-458.

Affiliated with

Also associated with

Rating

Method and apparatus for calibrating a test system for an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for calibrating a test system for an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for calibrating a test system for an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3737228