Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2006-04-06
2009-02-03
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Reexamination Certificate
active
07487413
ABSTRACT:
A memory module testing apparatus and method include a test slot adapted to receive a target memory module, wherein the target memory module includes a first memory unit to store information related to the target memory module. The memory module testing apparatus further includes a second memory unit adapted to store information related to a memory module, and a first switching unit adapted to selectively provide a driving signal to at least one of the first memory unit and the second memory unit.
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Ahn Young-man
Han You-keun
Lee Jung-kuk
Seo Seung-jin
Shin Seung-man
Kerveros James C
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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