4. Static information storage and retrieval
  5. Read/write circuit
  6. Signals

Seung-jin Seo

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Integrated circuit devices having delay circuits for...

Static information storage and retrieval – Read/write circuit – Signals
Reexamination Certificate

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Memory module testing apparatus and method of testing memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2784965

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