Memory diagnosis test circuit and test method using the same

Details Memory diagnosis test circuit and test method using the same Memory diagnosis test circuit and test method using the same

2007-10-31

2010-06-29

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

07747914

ABSTRACT:
According to an example embodiment, a memory diagnosis test circuit may include a memory core block, a word line selector, a bit line selector, and/or an analog mode control unit. The memory core block may include a plurality of memory cells. The word line selector may be configured to select one of a plurality of word lines of the memory core block using a first shift register. The bit line selector may be configured to select one of a plurality of bit line pairs of the memory core block using a second shift register. The analog mode control unit may be configured to monitor data corresponding to the selected word line and bit line pair.

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Office Action dated Dec. 17, 2008 for corresponding Korean Application No. 2007-0002176.

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