Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-09-07
2009-12-29
Ho, Tu-Tu V (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S244000, C438S248000, C438S386000, C438S391000, C438S430000, C257S303000, C257S300000, C257S301000, C257S903000, C257SE21396, C257SE21661, C257SE27098
Reexamination Certificate
active
07638390
ABSTRACT:
A static random access memory (SRAM) cell structure at least comprising a substrate, a transistor, an upper electrode and a capacitor dielectric layer. A device isolation structure is set up in the substrate to define an active region. The active region has an opening. The transistor is set up over the active region of the substrate. The source region of the transistor is next to the opening. The upper electrode is set up over the opening such that the opening is completely filled. The capacitor dielectric layer is set up between the upper electrode and the substrate.
REFERENCES:
patent: 5879980 (1999-03-01), Selcuk et al.
patent: 2004/0222489 (2004-11-01), Chang et al.
patent: 2005/0056885 (2005-03-01), Pai et al.
Larn Rern-Hurng
Lee Kuang-Pi
Lee Tzung-Han
Lin Wen-Jeng
Ho Tu-Tu V
J.C. Patents
United Microelectric Corp.
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