Low-thermal-budget gapfill process

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S296000, C438S294000

Reexamination Certificate

active

07087497

ABSTRACT:
A low-thermal-budget gapfill process is provided for filling a gap formed between two adjacent raised features on a strained-silicon substrate as part of a shallow-trench-isolation process. An electrically insulating liner is deposited using atomic-layer deposition and polysilicon is deposited over the electrically insulating liner, with both stages being conducted at temperatures below 700° C.

REFERENCES:
patent: 4690746 (1987-09-01), McInerney et al.
patent: 4737379 (1988-04-01), Hudgens et al.
patent: 4835005 (1989-05-01), Hirooka et al.
patent: 4890575 (1990-01-01), Ito et al.
patent: 5000113 (1991-03-01), Wang et al.
patent: 5521126 (1996-05-01), Okamura et al.
patent: 5645645 (1997-07-01), Zhang et al.
patent: 5712185 (1998-01-01), Tsai et al.
patent: 5719085 (1998-02-01), Moon et al.
patent: 5804259 (1998-09-01), Robles
patent: 5872058 (1999-02-01), Van Cleemput et al.
patent: 5910342 (1999-06-01), Hirooka et al.
patent: 5916365 (1999-06-01), Sherman
patent: 5923056 (1999-07-01), Lee et al.
patent: 5976327 (1999-11-01), Tanaka
patent: 5990013 (1999-11-01), Berenguer et al.
patent: 6013191 (2000-01-01), Nasser-Faili et al.
patent: 6013584 (2000-01-01), M'Saad
patent: 6025627 (2000-02-01), Forbes et al.
patent: 6030881 (2000-02-01), Papasouliotis et al.
patent: 6039851 (2000-03-01), Iyer
patent: 6087249 (2000-07-01), Gardner et al.
patent: 6194038 (2001-02-01), Rossum
patent: 6200893 (2001-03-01), Sneh
patent: 6217658 (2001-04-01), Orczyk et al.
patent: 6228751 (2001-05-01), Yamazaki et al.
patent: 6270572 (2001-08-01), Kim et al.
patent: 6305314 (2001-10-01), Sneh et al.
patent: 6313010 (2001-11-01), Nag et al.
patent: 6342277 (2002-01-01), Sherman
patent: 6355561 (2002-03-01), Sandhu et al.
patent: 6395150 (2002-05-01), Van Cleemput et al.
patent: 6416822 (2002-07-01), Chiang et al.
patent: 6428859 (2002-08-01), Chiang et al.
patent: 6596654 (2003-07-01), Bayman et al.
patent: 6897508 (2005-05-01), Sneh
patent: 2001/0002280 (2001-05-01), Sneh
patent: 2001/0028924 (2001-10-01), Sherman
patent: 2001/0031562 (2001-10-01), Raaijmakers et al.
patent: 2001/0041250 (2001-11-01), Werkhoven et al.
patent: 2002/0031618 (2002-03-01), Sherman
patent: 2002/0052128 (2002-05-01), Yu et al.
patent: 2002/0068466 (2002-06-01), Lee et al.
patent: 2003/0124818 (2003-07-01), Luo et al.
patent: 2005/0045092 (2005-03-01), Wu et al.
patent: 442 490 (1991-08-01), None
patent: 526 779 (1993-02-01), None
patent: 2 267 291 (1993-12-01), None
patent: 2 355 727 (2001-05-01), None
patent: 02-058836 (1990-02-01), None
patent: 07-161703 (1995-06-01), None
patent: WO 00/15865 (2000-03-01), None
patent: WO 00/54320 (2000-09-01), None
patent: WO 00/61833 (2000-10-01), None
patent: WO 01/40541 (2001-06-01), None
patent: WO 01/66832 (2001-09-01), None
“Atomic Layer Deposition” by Physical Inorganic Chemistry, Institute of Applied Synthetic Chemistry, downloaded from website http://www.ias.tuwien.ac.at/research/fghh/research/pic—research—ald.html on Jul. 23, 2002.
George et al., “Atomic layer controlled deposition of SiO2and Al2O3using ABAB . . . binary reaction sequence chemistry,”Applied Surface Science, 82/83:460-467 (1994).
George et al., “Surface Chemistry for Atomic Layer Growth,”J. Phys. Chem., 100(31):13121-13131 (1996).
Klaus et al., “Atomic layer controlled growth of SiO2films using binary reaction sequence chemistry,”Appl. Phys. Lett., 70(9): 1092-1094 (1997).
Klaus et al., “Atomic Layer Deposition of SiO2Using Catalyzed and Uncatalyzed Self-Limiting Surface Reactions,”Surface Review and Letters, 6(3/4):435-448 (1999).
Morishita et al., “New substances for atomic-layer deposition of silicon dioxide,”J. Non-Crystalline Solids, 187:66-69 (1995).
Nalwa, H.S.,Handbook of Low and High Dielectric Constant Materials and Their Applications, vol. 1, p. 66 (1999).
Nguyen, S.V., “High-Density Plasma Chemical Vapor Deposition of Silicon-Based Dielectric Films for Integrated Circuits,”Journal of Research and Development, 43(1/2) (1999).
Park, Yongjik & Kim, Kinam “COB Stack DRAM Cell Technology beyond 100 nm Technology Node (invited paper)” 2001 IEEE, 4 pages.
Singer, Peter “Strained Silicon Ready for Prime Time” Semiconductor International, Nov. 1, 2002, 3 pages.
Vassiliev et al., “Trends in Void-Free Pre-Metal CVD Dielectrics,”Solid State Technology, pp. 129-136 (2001).
Wise et al., “Diethyldiethoxysilane as a New Precursor for SiO2Growth on Silicon,” fromGas-Phase and SurfaceChemistry in electronic Materials Processing, Mountziaris et al., eds., from Symposium held Nov. 29, 1993 thru Dec. 2, 1993 in Boston Massachusetts, pp. 37-43.
Yamaguchi et al., “Atomic-layer chemical-vapor-deposition of silicon dioxide films with an extremely low hydrogen content,”Applied Surface Science, 130-132:202-207 (1998).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Low-thermal-budget gapfill process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Low-thermal-budget gapfill process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low-thermal-budget gapfill process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3631620

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.