Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-05-02
2006-05-02
Le, Thao P. (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257S314000
Reexamination Certificate
active
07037781
ABSTRACT:
Provided are a local SONOS-type memory device and a method of manufacturing the same. The device includes a gate oxide layer formed on a silicon substrate; a conductive spacer and a dummy spacer, which are formed on the gate oxide layer and separated apart from each other, the conductive spacer and the dummy spacer having round surfaces that face outward; a pair of insulating spacers formed on a sidewall of the conductive spacer and a sidewall of the dummy spacer which face each other; an ONO layer formed in a self-aligned manner between the pair of insulating spacers; a conductive layer formed on the ONO layer in a self-aligned manner between the pair of insulating spacers; and source and drain regions formed in the silicon substrate outside the conductive spacer and the dummy spacer.
REFERENCES:
patent: 6384450 (2002-05-01), Hidaka et al.
patent: 6518110 (2003-02-01), Wen
patent: 6583009 (2003-06-01), Hui et al.
patent: 6955963 (2005-10-01), Deleonibus et al.
Choi Yong-suk
Kim Seong-gyun
Yoon Seung-beom
Le Thao P.
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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