Lanthanide yttrium aluminum oxide dielectric films

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S240000, C438S261000, C257S310000, C257S324000, C257SE21002

Reexamination Certificate

active

07615438

ABSTRACT:
Electronic apparatus and methods of forming the electronic apparatus include a lanthanide yttrium aluminum oxide dielectric film on a substrate for use in a variety of electronic systems. The lanthanide yttrium aluminum oxide film may be structured as one or more monolayers. The lanthanide yttrium aluminum oxide film may be formed by atomic layer deposition.

REFERENCES:
patent: 6010969 (2000-01-01), Vaartstra
patent: 6063705 (2000-05-01), Vaartstra
patent: 6217645 (2001-04-01), Vaartstra
patent: 6225237 (2001-05-01), Vaartstra
patent: 6273951 (2001-08-01), Vaartstra
patent: 6329286 (2001-12-01), Vaartstra
patent: 6368398 (2002-04-01), Vaartstra
patent: 6368518 (2002-04-01), Vaartstra
patent: 6426292 (2002-07-01), Vaartstra
patent: 6445023 (2002-09-01), Vaartstra et al.
patent: 6455717 (2002-09-01), Vaartstra
patent: 6476434 (2002-11-01), Noble et al.
patent: 6682602 (2004-01-01), Vaartstra
patent: 6730163 (2004-05-01), Vaartstra
patent: 6730164 (2004-05-01), Vaartstra et al.
patent: 6784049 (2004-08-01), Vaartstra
patent: 6794284 (2004-09-01), Vaartstra
patent: 6863725 (2005-03-01), Vaartstra et al.
patent: 6958300 (2005-10-01), Vaartstra et al.
patent: 6967159 (2005-11-01), Vaartstra
patent: 6984592 (2006-01-01), Vaartstra
patent: 6995081 (2006-02-01), Vaartstra
patent: 7030042 (2006-04-01), Vaartstra et al.
patent: 7041609 (2006-05-01), Vaartstra
patent: 7057244 (2006-06-01), Andreoni et al.
patent: 7077902 (2006-07-01), Vaartstra
patent: 7087481 (2006-08-01), Vaartstra et al.
patent: 7112485 (2006-09-01), Vaartstra
patent: 7115166 (2006-10-01), Vaartstra et al.
patent: 7115528 (2006-10-01), Vaartstra et al.
patent: 7115566 (2006-10-01), Vaartstra et al.
patent: 7122464 (2006-10-01), Vaartstra
patent: 7125815 (2006-10-01), Vaartstra
patent: 7196007 (2007-03-01), Vaartstra
patent: 7250367 (2007-07-01), Vaartstra et al.
patent: 7253122 (2007-08-01), Vaartstra
patent: 7271077 (2007-09-01), Vaartstra et al.
patent: 7294556 (2007-11-01), Vaartstra
patent: 7300870 (2007-11-01), Vaartstra
patent: 7332442 (2008-02-01), Vaartstra et al.
patent: 7374617 (2008-03-01), Vaartstra
patent: 7368402 (2008-05-01), Vaartstra
patent: 7410918 (2008-08-01), Vaartstra
patent: 2001/0042505 (2001-11-01), Vaartstra
patent: 2003/0176065 (2003-09-01), Vaartstra
patent: 2003/0200917 (2003-10-01), Vaartstra
patent: 2003/0207540 (2003-11-01), Ahn et al.
patent: 2003/0213987 (2003-11-01), Basceri et al.
patent: 2004/0040494 (2004-03-01), Vaartstra et al.
patent: 2004/0040501 (2004-03-01), Vaartstra
patent: 2004/0043151 (2004-03-01), Vaartstra
patent: 2004/0043600 (2004-03-01), Vaartstra
patent: 2004/0043604 (2004-03-01), Vaartstra
patent: 2004/0043625 (2004-03-01), Vaartstra et al.
patent: 2004/0043630 (2004-03-01), Vaartstra et al.
patent: 2004/0043632 (2004-03-01), Vaartstra
patent: 2004/0043633 (2004-03-01), Vaartstra
patent: 2004/0043634 (2004-03-01), Vaartstra
patent: 2004/0043635 (2004-03-01), Vaartstra
patent: 2004/0043636 (2004-03-01), Vaartstra et al.
patent: 2004/0126954 (2004-07-01), Vaartstra et al.
patent: 2004/0152254 (2004-08-01), Vaartstra et al.
patent: 2004/0187968 (2004-09-01), Vaartstra
patent: 2004/0197946 (2004-10-01), Vaartstra et al.
patent: 2004/0214399 (2004-10-01), Ahn et al.
patent: 2004/0219746 (2004-11-01), Vaartstra et al.
patent: 2005/0009266 (2005-01-01), Vaartstra
patent: 2005/0009368 (2005-01-01), Vaartstra
patent: 2005/0019978 (2005-01-01), Vaartstra et al.
patent: 2005/0028733 (2005-02-01), Vaartstra
patent: 2005/0032360 (2005-02-01), Vaartstra
patent: 2005/0124109 (2005-06-01), Quevedo-Lopez et al.
patent: 2005/0124171 (2005-06-01), Vaartstra
patent: 2005/0136689 (2005-06-01), Vaartstra
patent: 2005/0160981 (2005-07-01), Vaartstra et al.
patent: 2005/0173755 (2005-08-01), Forbes
patent: 2005/0221006 (2005-10-01), Vaartstra
patent: 2005/0287804 (2005-12-01), Vaartstra
patent: 2005/0287819 (2005-12-01), Vaartstra et al.
patent: 2006/0046521 (2006-03-01), Vaartstra et al.
patent: 2006/0048711 (2006-03-01), Vaartstra
patent: 2006/0172485 (2006-08-01), Vaartstra
patent: 2006/0231017 (2006-10-01), Vaartstra
patent: 2006/0252244 (2006-11-01), Vaartstra et al.
patent: 2006/0252279 (2006-11-01), Vaartstra
patent: 2006/0258175 (2006-11-01), Vaartstra et al.
patent: 2006/0261389 (2006-11-01), Vaartstra
patent: 2006/0292788 (2006-12-01), Vaartstra
patent: 2007/0006798 (2007-01-01), Vaartstra et al.
patent: 2007/0144438 (2007-06-01), Vaartstra
patent: 2007/0155190 (2007-07-01), Vaartstra et al.
patent: 2007/0161260 (2007-07-01), Vaartstra
patent: 2007/0166999 (2007-07-01), Vaartstra
patent: 2007/0295273 (2007-12-01), Vaartstra
patent: 2008/0064210 (2008-03-01), Vaartstra
patent: 2008/0102629 (2008-05-01), Vaartstra
Copel, M. , et al., “Robustness of ultrathin aluminum oxide dielectrics on Si(001)”,Applied Physics Letters, vol. 78, No. 18, (Apr. 30, 2001),2670-2672.
Fischetti, Massimo V., et al., “Effective electron mobility in Si inversion layers in metal-oxide-semiconductor systems with a high-k insulator: The role of remote phonon scattering”,Journal of Applied Physics, vol. 90, No. 9, (Nov. 1, 2001),4587-4608.
Fischetti, M. V., et al., “Performance degradation of small silicon devices caused by long-range Coulomb interactions”,Applied Physics Letters, vol. 76, No. 16, (Apr. 17, 2000),2277-2279.
Giannozzi, Paolo , et al., “Ab initio calculation of phonon dispersions in semiconductors”,Physical Review B, vol. 43, No. 9, (Mar. 15, 1991),7231-7242.
Gordon, Roy G., et al., “Vapor Deposition of Metal Oxides and Silicates: Possible Gate Insulators for Future Microelectronics”,Chemistry of Materials, 13, (Jul. 10, 2001),2463-2464.
Jeong, Chang-Wook , et al., “Plasma-Assisted Atomic layer Growth of High-Quality Aluminum Oxide Thin Films”,Japanese Journal of Applied Physics, 40, (Jan. 2001),285-289.
Kim, C. T., et al., “Application of Al2O3 Grown by Atomic Layer Deposition to DRAM and FeRAM”,International Symposium in Integrated Ferroelectrics, (Mar. 2000),316.
Kim, Hyoungsub , et al., “Effects of crystallization on the electrical properties of ultrathin HfO2 dielectrics grown by atomic layer deposition”,Applied Physics Letters, vol. 82, No. 1, (Jan. 6, 2003),106-108.
Kim, Y. , et al., “Substrate dependence on the optical properties of Al/sub 2/O/sub 3/ films grown by atomic layer deposition”,Applied Physics Letters, 71(25 ), (Dec. 22, 1997),3604-3606.
Kingon, Angus I., et al., “Alternative dielectrics to Silicon dioxide for Memory and Logic Devices”,Nature, vol. 406, (Aug. 31, 2000),1032-1038.
Kukli, K. , et al., “Controlled growth of yttrium oxysulphide thin films by atomic layer deposition”,Materials Science Forum, 315-317, (1999),216-221.
Lu, Xu-Bing , et al., “Structure and dielectric prioperties of amorphous LaAlO3 and LaAlOxNy films as alternative gate dielectric materials”,Journal of Applied Physics, vol. 94, No. 2, (Jul. 15, 2003),1229-1234.
Molsa, Heini , et al., “Growth of yttrium oxide thin films from beta-diketonate precursor”,Advanced Materials for Optics and Electronics, 4(6), (Nov.-Dec. 1994),389-400.
Nieminen, Minna , et al., “Formation and stability of lanthanum oxide thin films deposited from B-diketonate precursor”,Applied Surface Science, 174(2), (Apr. 16, 2001),155-165.
Peercey, Paul S., “The drive to miniaturization”,Nature, vol. 406, (Aug. 31, 2000),1023-1026.
Punchaipetch, Prakaipetch , et al., “Growth and characterization of hafnium silicate films prepared by UV/ozone oxidation”,J. Vac. Sci. Technol. A 22(2), (Mar./Apr. 2004),395-400.
Putkonen, Matti , et al., “Low-Temperature ALE Deposition of Y2O3 Thin Films from Beta-Didetonate Precursors”,Chemical Vapor Deposition, Vo. 7, No. 1, (2001),44-50.
Rignanese, G.-M. , et al., “Dielectric Constants of Zr Silicates: A First-Principles Study”,Physical Review Letters, Vo.. 89, No. 11, (Sep. 9, 2002),117601-1 through 117601-4.
Shevlin, Stephen A., et al., “Ab Initii

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