4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

David Sliwinski

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Isolating the location of defects in scan chains

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and article of manufacture to generate IC test vector...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-3209621

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