Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Reexamination Certificate
2004-03-31
2008-08-12
Andujar, Leonardo (Department: 2826)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Metallic housing or support
C438S106000, C257S778000
Reexamination Certificate
active
07410833
ABSTRACT:
An interconnection structure suitable for flip-chip attachment of microelectronic device chips to packages, comprising a two, three or four layer ball-limiting composition including an adhesion/reaction barrier layer, and having a solder wettable layer reactive with components of a tin-containing lead free solder, so that the solderable layer can be totally consumed during soldering, but a barrier layer remains after being placed in contact with the lead free solder during soldering. One or more lead-free solder balls is selectively situated on the solder wetting layer, the lead-free solder balls comprising tin as a predominant component and one or more alloying components.
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Fogel Keith E.
Ghosal Balaram
Kang Sung K.
Kilpatrick Stephen
Lauro Paul A.
Aker David
Andujar Leonardo
International Business Machines - Corporation
Morris Daniel P.
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