Integrated module having a plurality of separate substrates

Details Integrated module having a plurality of separate substrates Integrated module having a plurality of separate substrates

2007-06-05

2007-06-05

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S048000

Reexamination Certificate

active

11090831

ABSTRACT:
The invention relates to a module having a first integrated circuit and a second integrated circuit which are arranged on separate substrates, having a first output terminal and a second output terminal to which the first and second integrated circuits are respectfully connected in a parallel manner, and having a first selection terminal and a second selection terminal which are mutually separate and are connected to the first and second integrated circuits, respectively. A test circuit is provided in each of the integrated circuits to generate an error signal depending on whether an error occurred during a test operation, and an output circuit is provided in each of the integrated circuits to select the first output terminal or the second output terminal, depending on a selection signal that is applied to the respective selection terminal, for the purpose of outputting a state that indicates the error.

REFERENCES:
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patent: 0 733 910 (1996-09-01), None
patent: WO 02/075926 (2002-09-01), None
German Patent Office Examination Report dated Dec. 23, 2004.

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