Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Configuration or pattern of bonds
Reexamination Certificate
2009-10-20
2011-10-04
Sefer, A. (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Configuration or pattern of bonds
C257SE29119, C257SE23011, C257SE23067, C438S118000
Reexamination Certificate
active
08030783
ABSTRACT:
A method of manufacturing an integrated circuit package includes: forming a substrate that includes: forming a core layer, forming vias in the core layer, and forming a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias; and forming connections between an integrated circuit die and the conductive layer.
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Filoteo, Jr. Dario S.
Li Jian Jun
Shim Il Kwon
Tan Kwee Lan
Ishimaru Mikio
Nguyen Dilinh
Sefer A.
St Assembly Test Services Ltd.
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