Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond
Reexamination Certificate
2005-12-27
2005-12-27
Clark, Jasmine (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Die bond
C257S782000, C257S783000, C257S786000
Reexamination Certificate
active
06979907
ABSTRACT:
An integrated circuit package is provided. A substrate is provided having solder openings therein and a conductive layer thereon. The conductive layer is processed to form a plurality of pads over the solder openings in the substrate. A mask is formed over the plurality of pads and openings formed in the mask over at least two pads of the plurality of pads. An integrated circuit die is bonded over the substrate using a conductive adhesive where the conductive adhesive is placed in the openings in conductive contact with at least two pads of the plurality of pads.
REFERENCES:
patent: 5736789 (1998-04-01), Moscicki
patent: 5808873 (1998-09-01), Celaya et al.
patent: 6025650 (2000-02-01), Tsuji et al.
patent: 6034437 (2000-03-01), Shibata
patent: 6593658 (2003-07-01), Huang et al.
patent: 6707152 (2004-03-01), Schrock
patent: 5-129366 (1993-05-01), None
Badakere Guruprasad
Li Jian Jun
Shim Il Kwon
Clark Jasmine
Ishimaru Mikio
St Assembly Test Services Ltd.
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