Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-07-08
2008-07-08
Le, Thao P. (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21444, C438S183000
Reexamination Certificate
active
07396730
ABSTRACT:
Integrated circuit devices include an integrated circuit substrate having a channel region therein. A gate pattern is disposed on a top surface of the channel region. A depletion barrier layer covers a surface of the integrated circuit substrate adjacent opposite sides of the gate pattern and extending along a portion of a lateral face of the channel region. A source/drain layer is disposed on the depletion barrier layer and electrically contacting the lateral face of the channel region in a region not covered by the depletion barrier layer. The channel region may protrude from a surface of the substrate. The depletion barrier layer may be an L-shaped depletion barrier layer and the device may further include a device isolation layer disposed at a predetermined portion of the substrate through the source/drain layer and the depletion barrier layer. The depletion barrier layer and the device isolation layer may be formed of the same material.
REFERENCES:
patent: 5759901 (1998-06-01), Loh et al.
patent: 5994731 (1999-11-01), Sato
patent: 6051509 (2000-04-01), Tsuchiaki
patent: 6124614 (2000-09-01), Ryum et al.
patent: 6346729 (2002-02-01), Liang et al.
patent: 6475847 (2002-11-01), Ngo et al.
patent: 6583000 (2003-06-01), Hsu et al.
patent: 6864547 (2005-03-01), Michejda et al.
patent: 7067881 (2006-06-01), Matsumoto et al.
patent: 2004/0188774 (2004-09-01), Takeda et al.
patent: 2006/0051922 (2006-03-01), Huang et al.
patent: 11-186544 (1999-07-01), None
patent: 010004089 (2001-01-01), None
Le Thao P.
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
LandOfFree
Integrated circuit devices including an L-shaped depletion... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit devices including an L-shaped depletion..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit devices including an L-shaped depletion... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2767292