Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-03-22
2009-10-06
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S202000, C438S203000, C438S211000, C438S257000, C438S593000, C257SE27133, C257SE27135, C257SE27138
Reexamination Certificate
active
07598136
ABSTRACT:
An image sensor comprising a transfer gate electrode having a uniform impurity doping distribution is provided. The image sensor further comprises a semiconductor substrate comprising a pixel area, wherein the pixel area comprises an active region and the transfer gate electrode is disposed on the active region. A method of fabricating the image sensor is also provided. The method comprises preparing a semiconductor substrate, forming a polysilicon layer on the semiconductor substrate, doping the polysilicon layer with impurity ions, and patterning the polysilicon layer.
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Park Won-Je
Park Young-Hoon
Song Jae-Ho
Richards N Drew
Samsung Electronics Co,. Ltd.
Singal Ankush K
Volentine & Whitt P.L.L.C.
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