X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate
2006-02-28
2006-02-28
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Lithography
C378S085000, C250S492200, C355S053000, C355S067000
Reexamination Certificate
active
07006595
ABSTRACT:
There is provided an illumination system for scannertype microlithography along a scanning direction with a light source emitting a wavelength ≦193 nm. The illumination system includes a plurality of raster elements. The plurality of raster elements is imaged into an image plane of the illumination system to produce a plurality of images being partially superimposed on a field in the image plane. The field defines a non-rectangular intensity profile in the scanning direction.
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Antoni Martin
Dinger Udo
Hainz Joachim
Schultz Jörg
Schuster Karl-Heinz
Carl Zeiss Semiconductor Manufacturing Technologies AG
Ho Allen C.
Ohlandt, Greeley, Ruggiero & Perle LLP.
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