IC with internal interface switch for testability

Details IC with internal interface switch for testability IC with internal interface switch for testability

2006-03-14

2006-03-14

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07013415

ABSTRACT:
A semiconductor integrated circuit which is provided with a shift scan path incorporated in each function module and a testing I/O terminal connected to a shift scan path and provided separately from a normal-operation-use I/O terminal, and which comprises, all formed on one semiconductor chip, a bus interface circuit for connecting normal-operation-use I/O terminals of a plurality of function modules to a bus, an external interface switching circuit which switches between the bus-side I/O terminal of the bus interface circuit and the testing I/O terminal of each function module for connection to an external terminal and an interface control circuit for switch-controlling the external interface switching circuit.

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IEEE Standard 1149.1-1990 “IEEE Standard Test Access Port and Boundary-Scan Architecture”.

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