I/O driver design for simultaneous switching noise minimization

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438133, 438210, 438238, 438307, H01L 218238

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active

058438130

ABSTRACT:
VLSI I/O structures to reduce the effects of simultaneous switching noise (SSN) on output driver circuits and enhance electrostatic discharge immunity, while reducing chip area, in both input receiver circuits and output driver circuits include improved transistors having deep-junction drain and a multi-cascaded, resistive deep-junction source structure.

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