Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1998-06-24
2000-03-14
Chaudhari, Chandra
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438298, 438443, H01L 21336
Patent
active
06037229&
ABSTRACT:
A method for fabricating a high-voltage device substrate comprising the steps of forming a pad oxide layer and a mask layer over a substrate. Then, the pad oxide layer and the mask layer are patterned to define a region for a first ion implantation. Next, the exposed substrate is oxidized to form a field oxide layer. Thereafter, the mask layer is removed followed by a first ion implantation. Next, a portion of the field oxide layer is removed, and then a second ion implantation is performed implanting ions into the exposed substrate. Then, a conformal oxide layer is formed over the substrate surface. Next, a high temperature drive-in and oxidation operation is carried out, in which ions in the first ion implanted region and the second ion implanted region are driven deeper into the substrate interior, and at the same time the substrate above those regions are oxidized. Finally, the oxide layer on the substrate surface is removed, and then an epitaxial layer is formed over the substrate.
REFERENCES:
patent: 5108937 (1992-04-01), Tsai et al.
patent: 5814544 (1998-09-01), Huang
patent: 5837553 (1998-11-01), Pearce
Chaudhari Chandra
United Microelectronics Corp.
LandOfFree
High-voltage device substrate structure and method of fabricatio does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High-voltage device substrate structure and method of fabricatio, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-voltage device substrate structure and method of fabricatio will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-168795