Method of fabricating self-aligned contact window which includes

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438279, 438593, 438595, 438592, 438303, 438634, 438261, 257382, 257383, 257412, 257900, H01L 218238, H01L 21336, H01L 213206, H01L 2976, H01L 27088

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active

060372281

ABSTRACT:
A method of fabricating a self-aligned contact window is described. A gate oxide layer, a conductive layer, a first oxide layer and an undoped polysilicon layer are successively formed on a substrate. These layers above are patterned to form a gate structure. A water clean step is performed, producing a recess in the first oxide layer. A second oxide layer is thermally formed on the surface of the gate structure. An undoped polysilicon spacer is formed on the sidewall of the gate structure and a portion of the undoped polysilicon spacer extends into the recess of the first oxide layer. A dielectric layer is formed over the substrate and using the undoped polysilicon spacer as an etching stop, a self-aligned contact window is formed to expose the source/drain region.

REFERENCES:
patent: 5491100 (1996-02-01), Lee et al.
patent: 5545578 (1996-08-01), Park et al.
patent: 5559049 (1996-09-01), Cho
patent: 5897353 (1999-04-01), Kim et al.

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