High-speed semiconductor memory test device

Details High-speed semiconductor memory test device High-speed semiconductor memory test device

2009-06-11

2011-10-18

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S724000, C714S744000

Reexamination Certificate

active

08042015

ABSTRACT:
A semiconductor test device includes; a tester providing a first clock signal, first test data, a control signal and a first clock signal, a reference clock generating unit generating a reference clock signal, a clock converting unit receiving the reference clock signal and converting the frequency of the reference clock signal to a second clock signal in response to the control signal, and a test data converting unit receiving the first test data, converting the first test data to second test data synchronously with the second clock signal and providing the second test data to a semiconductor memory device under test.

REFERENCES:
patent: 2004/0044491 (2004-03-01), Yonaga et al.
patent: 2005/0246603 (2005-11-01), Rottacker et al.
patent: 2008/0103719 (2008-05-01), Seong
patent: 2009/0063913 (2009-03-01), Yamasaki et al.
patent: 11038100 (1999-02-01), None
patent: 1020010045334 (2001-06-01), None
patent: 1020060085434 (2006-07-01), None
Yoshiyuki Nakamura ; Thomas Clouqueur ; Kewal K. Saluja ; Hideo Fujiwara ; Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester, Issue Date : Nov. 2006—on p. 409—ISSN : 1081-7735—Print ISBN: 0-7695-2628-4 INSPEC Accession No. 9308646—Digital Object Identifier : 10.1109/ATS.2006.260963.

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