High-K metal gate CMOS

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S275000, C438S287000, C438S767000

Reexamination Certificate

active

07943460

ABSTRACT:
A method of forming a semiconductor device is provided that includes forming a Ge-containing layer atop a p-type device regions of the substrate. Thereafter, a first dielectric layer is formed in a second portion of a substrate, and a second dielectric layer is formed overlying the first dielectric layer in the second portion of the substrate and overlying a first portion of the substrate. Gate structures may then formed atop the p-type device regions and n-type device regions of the substrate, in which the gate structures to the n-type device regions include a rare earth metal.

REFERENCES:
patent: 5777364 (1998-07-01), Crabbeet et al.
patent: 6339232 (2002-01-01), Takagi
patent: 6784507 (2004-08-01), Wallace et al.
patent: 6787421 (2004-09-01), Gilmer et al.
patent: 6979623 (2005-12-01), Rotondaro et al.
patent: 7160771 (2007-01-01), Chou et al.
patent: 7297587 (2007-11-01), Wu et al.
patent: 7351632 (2008-04-01), Visokay et al.
patent: 2005/0233533 (2005-10-01), Alshareef et al.
patent: 2005/0238447 (2005-10-01), Murota et al.
patent: 2005/0269634 (2005-12-01), Bojarczuk, Jr. et al.
patent: 2006/0244035 (2006-11-01), Bojarczuk et al.
patent: 2006/0289948 (2006-12-01), Brown et al.
patent: 2007/0090416 (2007-04-01), Doyle et al.
patent: 2007/0148838 (2007-06-01), Doris et al.
patent: 2007/0187725 (2007-08-01), Wang et al.
patent: 2008/0017936 (2008-01-01), Buchanan et al.
patent: 2008/0079086 (2008-04-01), Jung et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High-K metal gate CMOS does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High-K metal gate CMOS, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-K metal gate CMOS will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2635904

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.