High integrity borderless vias with HSQ gap filled patterned con

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438622, 438624, 438631, 438637, 438958, 438626, H01L 214763

Patent

active

060936355

ABSTRACT:
Borderless vias are formed in electrical connection with a lower metal feature of a metal pattern gap filled with HSQ. Heat treatment in an inert atmosphere is conducted before filling the through-hole to outgas water absorbed during solvent cleaning of the through-hole, thereby reducing via void formation and improving via integrity.

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