Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2009-06-30
2011-12-06
Trimmings, John (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S028000, C714S030000, C714S025000, C714S037000, C714S039000, C714S038130, C714S045000, C714S732000, C714S734000, C714S733000, C703S023000, C703S028000, C703S026000, C717S138000, C717S134000, C717S127000, C717S124000, C717S128000
Reexamination Certificate
active
08074131
ABSTRACT:
A high integration integrated circuit may comprise a plurality of processing cores, a graphics processing unit, and an uncore area coupled to an interface structure such as a ring structure. A generic debug external connection (GDXC) logic may be provisioned proximate to the end point of the ring structure. The GDXC logic may receive internal signals occurring in the uncore area, within the ring structure and on the interfaces provisioned between the plurality of cores and the ring structure. The GDXC logic may comprise a qualifier to selectively control the entry of the packets comprising information of the internal signals into the queue. The GDXC logic may then transfer the packets stored in the queues to a port provisioned on the surface of the integrated circuit packaging to provide an external interface to the analysis tools.
REFERENCES:
patent: 5848264 (1998-12-01), Baird et al.
patent: 6738929 (2004-05-01), Swoboda et al.
patent: 7058855 (2006-06-01), Rohfleisch et al.
patent: 7080283 (2006-07-01), Songer et al.
patent: 7107494 (2006-09-01), Tischler
patent: 7627784 (2009-12-01), Allen et al.
patent: 7665002 (2010-02-01), White et al.
patent: 7848913 (2010-12-01), Salmonsen
patent: 2005/0223359 (2005-10-01), Rao Nagaraju et al.
patent: 2005/0289400 (2005-12-01), Kimura
patent: 2008/0126871 (2008-05-01), Nardini et al.
patent: 2009/0177923 (2009-07-01), McGowan
patent: 2010/0318972 (2010-12-01), Xu et al.
Elmosnino Sharon
Hazan Eilon
Kurts Tsvika
Ratner Jason
Santhanakrishnan Geeyarpuram N.
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Trimmings John
LandOfFree
Generic debug external connection (GDXC) for high... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Generic debug external connection (GDXC) for high..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Generic debug external connection (GDXC) for high... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4316684