Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-04-25
2006-04-25
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S680000
Reexamination Certificate
active
07033945
ABSTRACT:
A method of filling a gap formed between adjacent raised surfaces on a substrate. In one embodiment the method comprises depositing a boron-doped silica glass (BSG) layer over the substrate to partially fill the gap using a thermal CVD process; exposing the BSG layer to a steam ambient at a temperature above the BSG layer's Eutectic temperature; removing an upper portion of the BSG layer by exposing the layer to a fluorine-containing etchant; and depositing an undoped silica glass (USG) layer over the BSG layer to fill the remainder of the gap.
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Byun Jeong Soo
Karim M. Ziaul
Pham Thanh N.
Venkataraman Shankar
Yieh Ellie Y.
Applied Materials
Nhu David
Townsend & Townsend & Crew LLP
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