Final via structures for bond pad-solder ball interconnections

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond

Reexamination Certificate

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Details

C257S780000, C257S784000, C257S774000, C257S750000, C257S758000, C257S738000, C257SE23011, C257SE23015, C257SE23019, C257SE23020, C438S614000

Reexamination Certificate

active

07859122

ABSTRACT:
A structure and a method for forming the same. The structure includes a first dielectric layer, an electrically conductive bond pad on the first dielectric layer, and a second dielectric layer on top of the first dielectric layer and the electrically conductive bond pad. The electrically conductive bond pad is sandwiched between the first and second dielectric layers. The second dielectric layer includes N separate final via openings such that a top surface of the electrically conductive bond pad is exposed to a surrounding ambient through each final via opening of the N separate final via openings. N is a positive integer greater than 1.

REFERENCES:
patent: 4290079 (1981-09-01), Carpenter et al.
patent: 5838023 (1998-11-01), Goel et al.
patent: 6521996 (2003-02-01), Seshan
patent: 6709964 (2004-03-01), Lee
patent: 7267883 (2007-09-01), Fujihara et al.
patent: 2007/0210425 (2007-09-01), Ramakrishna et al.
patent: 3-242938 (1991-10-01), None

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