Film formation method and apparatus for semiconductor...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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C438S792000, C438S775000

Reexamination Certificate

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07462571

ABSTRACT:
An impurity-doped silicon nitride or oxynitride film is formed on a target substrate by CVD, in a process field to be selectively supplied with a first process gas containing a silane family gas, a second process gas containing a nitriding or oxynitriding gas, and a third process gas containing a doping gas. This method alternately includes first to fourth steps. The first step performs supply of the first and third process gases to the field. The second step stops supply of the first to third process gases to the field. The third step performs supply of the second process gas to the field while stopping supply of the first and third process gases to the field, and includes an excitation period of exciting the second process gas by an exciting mechanism. The fourth step stops supply of the first to third process gases to the field.

REFERENCES:
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patent: 2003/0232514 (2003-12-01), Kim et al.
patent: 2006/0014399 (2006-01-01), Joe
patent: 0394054 (1990-10-01), None
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patent: 8-31454 (1996-03-01), None
patent: 2000-100812 (2000-04-01), None
patent: 2004-6801 (2004-01-01), None
patent: 2003-0072104 (2003-09-01), None

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