External scan circuitry connected to leads extending from...

Details External scan circuitry connected to leads extending from... External scan circuitry connected to leads extending from...

2006-05-01

2008-10-21

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

07441170

ABSTRACT:
An integrated circuit carries an intellectual property core. The intellectual property core includes a test access port39with test data input leads15, test data output leads13, control leads17and an external register present, ERP lead37. A scan register25encompasses the intellectual property core and ERP lead37carries a signal indicating the presence of the scan register.

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patent: 6658615 (2003-12-01), Whetsel
patent: 7065692 (2006-06-01), Whetsel

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