Etching solution for silicon oxide method of manufacturing a...

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S689000, C438S704000, C216S089000, C216S083000, C134S001300

Reexamination Certificate

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07351667

ABSTRACT:
An etching solution for silicon oxide may be used in a process for enlarging an opening formed through a silicon oxide layer. The etching solution includes about 0.2 to about 5.0 percent by weight of a hydrogen fluoride solution, about 0.05 to about 20.0 percent by weight of an ammonium fluoride solution, about 40.0 to about 70.0 percent by weight of an alkyl hydroxide solution and remaining water. The etching solution may etch the silicon oxide layer without damage to a metal silicide layer exposed by the opening.

REFERENCES:
patent: 4890141 (1989-12-01), Tang et al.
patent: 7094660 (2006-08-01), Park
patent: 2005/0081883 (2005-04-01), Ko et al.
patent: 10-189722 (1998-07-01), None
patent: 11-087325 (1999-03-01), None
patent: 11-135490 (1999-05-01), None
patent: 1999-65097 (1999-08-01), None
patent: 10-0453908 (2004-10-01), None
S. Wolf, Silicon Processing for the VLSI Era, vol. 1, Lattice Press (1986), pp. 532-533.

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