Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2008-04-01
2008-04-01
Deo, Duy-Vu N. (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S689000, C438S704000, C216S089000, C216S083000, C134S001300
Reexamination Certificate
active
07351667
ABSTRACT:
An etching solution for silicon oxide may be used in a process for enlarging an opening formed through a silicon oxide layer. The etching solution includes about 0.2 to about 5.0 percent by weight of a hydrogen fluoride solution, about 0.05 to about 20.0 percent by weight of an ammonium fluoride solution, about 40.0 to about 70.0 percent by weight of an alkyl hydroxide solution and remaining water. The etching solution may etch the silicon oxide layer without damage to a metal silicide layer exposed by the opening.
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Hwang Dong-Won
Lim Kwang-shin
Park Jung-dae
Yi Hun-Jung
Angadi Maki
Deo Duy-Vu N.
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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