Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-19
2008-11-25
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C714S738000
Reexamination Certificate
active
07458046
ABSTRACT:
Estimating the difficulty level of a verification problem includes receiving input comprising a design and properties that may be verified on the design. Verification processes are performed for each property on the design. A property verifiability metric value is established for each property in accordance with the verification processes, where a property verifiability metric value represents a difficulty level of verifying the property on the design. A design verifiability metric value is determined from the property verifiability metric values, where the design verifiability metric value represents a difficulty level of verifying the design.
REFERENCES:
patent: 5418792 (1995-05-01), Maamari
patent: 6496961 (2002-12-01), Gupta et al.
patent: 6567946 (2003-05-01), Nozuyama
patent: 6687558 (2004-02-01), Tuszynski
patent: 6714902 (2004-03-01), Chao et al.
patent: 6738955 (2004-05-01), Andersen et al.
patent: 6782515 (2004-08-01), Scott et al.
patent: 6886124 (2005-04-01), Wang
patent: 7047510 (2006-05-01), Chopra et al.
patent: 7073143 (2006-07-01), Huang
patent: 7130783 (2006-10-01), Harer et al.
patent: 7191374 (2007-03-01), Maamari et al.
patent: 2003/0225552 (2003-12-01), Ganai et al.
patent: 2004/0093571 (2004-05-01), Jain et al.
patent: 2005/0138474 (2005-06-01), Jain et al.
patent: 2005/0193304 (2005-09-01), Abraham et al.
patent: 2005/0262456 (2005-11-01), Prasad
patent: 2006/0161648 (2006-07-01), Ding et al.
patent: 2006/0212837 (2006-09-01), Prasad
patent: 2006/0236274 (2006-10-01), Baumgartner et al.
patent: 2006/0242515 (2006-10-01), Alvamani et al.
patent: 2007/0011629 (2007-01-01), Shacham et al.
patent: 1421013 (2003-05-01), None
Nudelman et al.;“SATzilla: An Algorithm Portfolio for SAT”; SAT 2003 Competition, in conjunction with the Sixth International Conference on the Theory and Applications of Satisfiability Testing. pp. 1-2.
Achlioptas et al.; “Generating Satisfiable Problem Instances”; 2000, American Association for Artificial Intelligence (www.aaai.org). pp. 1-6.
Ghosh et al.; “A BIST Scheme for RTL Circuits Based on Symbolic Testability Analysis”; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 19, No. 1, Jan. 2000; pp. 111-128.
Ghosh et al.; “Design for Veri cation at the Register Transfer Level”; Proceedings of the 15th International Conference on VLSI Design; 2002; pp. 420-425.
Ghosh et al.i On automatic generation of RTL validation test benches using circuit testing techniques:; ACM Great Lakes Symposium on VLSI 2003: 289-294.
Lawrence H. Goldstein, et al., “SCOAP: Sandia Controllability/Observability Analysis Program”, Sandia National Laboratories, pp. 190-196.
Robert K. Brayton, et al., “VIS: A System for Verification and Synthesis”, 4 pages.
Vamsi Boppana, et al., “Model Checking Based on Sequential ATPG”, Fujitsu Laboratories of America, Inc., Sunnyvale, California, 13 pages.
Edmund Clarke, et al., “Bounded Model Checking Using Satisfiability Solving”, pp. 1-20.
Indradeep Ghosh, et al., “Design for Verification at the Register Transfer Level”, 6 pages.
K. L. McMillan, et al., “Automatic Abstraction without Counterexamples”, © 2002 Cadence Berkeley Labs, Cadence Design Systems, pp. 1-21.
Jacob A. Abraham, et al., “Verifying Properties Using Sequential ATPG”, 9 pages.
Aarti Gupta, et al., “Iterative Abstraction using SAT-based BMC with Proof Analysis”, ICCAD '03, Copyright 2003, ACM 1-58113-762-1/03/0011, pp. 416-423.
Fan, Yong, et al.,“An Improved Weighted Average Algorithm for Calculating Signal Probability of Combinational Circuit”, Journal of Electronic Measurement and Instrument, vol. 9, No. 1, English translation of the abstract only, 5 pages.
Communication from The State Intellectual Property Office of China, First Notification of Office Action transmitted to Baker Botts via facsimile Dec. 29, 2007, for Application No. 2006101059436, 12 pages.
M. K. Iyer, et al., “Satori—A Fast Sequential SAT Engine For Circuits”, ICCAD '03, Copyright 2003, ACM 1-58113-762-1/03/001, pp. 320-325, Nov. 11-13, 2003.
Peter C. Mehlitz, et al., “Design for Verification Using Design Patterns to Build Reliable Systems”, 6 pages, 2003.
Christian Stangier, et al., “Invariant Checking Combining Forward and Backward Traversal”, Fujitsu Labs of America, Inc., 15 pages, 2004.
Ghosh Indradeep
Prasad Mukul R.
Baker & Botts L.L.P.
Chiang Jack
Fujitsu Limited
Levin Naum
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