Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-03-01
2011-03-01
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S731000, C714S746000
Reexamination Certificate
active
07900114
ABSTRACT:
An electronic device includes an integrated circuit operating on the basis of an operating clock signal, an error detection circuit and a control circuit coupled to the error detection circuit. The control circuit is configured to increase the frequency of the operating clock signal starting from a nominal operating frequency of the integrated circuit, to evaluate a frequency increment at which an error is detected by the error detection circuit, and to reset the frequency of the operating clock signal to said nominal frequency.
REFERENCES:
patent: 6118745 (2000-09-01), Hutchins et al.
patent: 6160755 (2000-12-01), Norman et al.
patent: 6891339 (2005-05-01), Ribarich et al.
patent: 2004/0141576 (2004-07-01), Sonoda
patent: 2005/0262376 (2005-11-01), McBain
patent: 2007/0288798 (2007-12-01), Flautner et al.
patent: 102005049232 (2007-04-01), None
patent: WO2004084070 (2004-09-01), None
patent: WO2007045202 (2007-04-01), None
Austin et al, “Making Typical Silicon Matter with Razor”, IEEE Computer Socitey, Mar. 2004, pp. 41-49.
Henzler Stephan
Lorenz Dominik
Wirnshofer Martin
Infineon - Technologies AG
Lee & Hayes PLLC
Ton David
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