Error catch RAM support using fan-out/fan-in matrix

Details Error catch RAM support using fan-out/fan-in matrix Error catch RAM support using fan-out/fan-in matrix

2007-08-24

2010-11-02

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C710S071000

Reexamination Certificate

active

07827452

ABSTRACT:
In accordance with one embodiment of the invention, a method and apparatus are provided for obtaining test data from multiples devices under test. This could be accomplished in accordance with one embodiment by outputting from a testing device a test signal for input in parallel to at least two devices under test; inputting in parallel to the testing device at least two response signals, each response signal produced by one of the at least two devices under test; storing the response signals received in parallel in a storage device; and serially outputting the response signals from the storage device.

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