Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-10-16
2007-10-16
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000
Reexamination Certificate
active
11024574
ABSTRACT:
An enhanced JTAG interface provides an additional clock output at any desired I/O port of a logic device during normal operation. The interface includes a boundary scan data cell associated with each I/O port that enables either input data to the I/O port in a normal mode or routes the boundary scan input data during a JTAG operation. A control cell is associated with each data cell for selectively enabling either a normal mode or a JTAG mode of the boundary scan cell. A set of JTAG instructions enable/disable JTAG operation and select JTAG functions. The boundary scan data cell is modified to incorporate a multiplexing arrangement to selectively route the JTAG clock to the I/O port when required. The control cell is modified to selectively enable/disable the routing of the JTAG clock in the boundary scan data cell.
REFERENCES:
patent: 6567943 (2003-05-01), Barnhart et al.
patent: 6681359 (2004-01-01), Au et al.
patent: 7007099 (2006-02-01), Donati et al.
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Gandhi Dipakkumar
Jorgenson Lisa K.
Lamarre Guy
STMicroelectronics Pvt Ltd.
LandOfFree
Enhanced JTAG interface does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Enhanced JTAG interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Enhanced JTAG interface will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3888637