Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2005-05-24
2005-05-24
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
C356S367000
Reexamination Certificate
active
06897955
ABSTRACT:
This invention concerns an ellipsometer for the examination of a sample whereby the ellipsometer has a broadband light source on the emitter side and a detector on the receiver side for a receiver light beam reflected from the sample. A refractive optic for the generation of a measuring spot on the sample and an aperture arranged on the emitter side for the definition of a measuring spot on the sample. The spectroscopic ellipsometer of the present invention makes it possible to easily produce a precisely defined measuring spot on the sample.
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Arena Michael
Dittmar Georg
Kruger Albrecht
Richter Uwe
Wielsch Uwe
Christie Parker and Hale, LLP
Sentech Instruments GmbH
Stafira Michael P.
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