Ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Details

C356S367000

Reexamination Certificate

active

06897955

ABSTRACT:
This invention concerns an ellipsometer for the examination of a sample whereby the ellipsometer has a broadband light source on the emitter side and a detector on the receiver side for a receiver light beam reflected from the sample. A refractive optic for the generation of a measuring spot on the sample and an aperture arranged on the emitter side for the definition of a measuring spot on the sample. The spectroscopic ellipsometer of the present invention makes it possible to easily produce a precisely defined measuring spot on the sample.

REFERENCES:
patent: 3880524 (1975-04-01), Dill et al.
patent: 4671660 (1987-06-01), Distl et al.
patent: 5166752 (1992-11-01), Spanier et al.
patent: 5793480 (1998-08-01), Lacey et al.
patent: 5910841 (1999-06-01), Masao
patent: 5910842 (1999-06-01), Piwonka-Corle et al.
patent: 5955139 (1999-09-01), Iturralde
patent: 6060237 (2000-05-01), Nygren et al.
patent: 6275291 (2001-08-01), Abraham et al.
patent: 6307627 (2001-10-01), Vurens
patent: 24 30 521 (1975-01-01), None
patent: 196 22 212 (1997-12-01), None
patent: 197 08 036 (1998-09-01), None
patent: 198 42 364 (2000-04-01), None
patent: 11173994 (1999-07-01), None
patent: 11 173994 (1999-07-01), None
International Search Report of PCT/DE01/01807, dated Dec. 28, 2001.
International Preliminary Examination Report of PCT/DE01/01807, dated Oct. 15, 2002.
Patent Abstract of Japan, Publication No. 11173994, Published on Jul. 2, 1999, in the name of HDI Instrumentation.
English translation of International Preliminary Examination Report of corresponding PCT/DE01/01807, dated Oct. 15, 2002.

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