4. Optics: measuring and testing
  5. By polarized light examination
  6. Of surface reflection

Sentech Instruments GmbH

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Ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Method and arrangement for charge carrier profiling in semicondu

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method for the determination of characteristic values of transpa

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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