Static information storage and retrieval – Read/write circuit – Precharge
Patent
1993-11-04
1995-05-09
Epps, Georgia Y.
Static information storage and retrieval
Read/write circuit
Precharge
365149, 365208, G11C 702
Patent
active
054146623
ABSTRACT:
Apparatus and methods for controlling the sensing of bit lines which facilitates the distribution of bit line charging current to be distributed any time, and facilitates the fast raising of the sense modes to full logic levels. An embodiment is comprised of a plurality of bit storage capacitors, a folded bit line for receiving charge stored on one of the capacitors, having bit line capacitance, a sense amplifier having a pair of sense nodes for sensing a voltage differential across the sense nodes, apparatus connected to the bit line and the sense nodes for imperfectly isolating the sense nodes from the bit line whereby current can leak therethrough, apparatus for enabling the sense amplifier and for disabling the isolating apparatus and thereby removing the isolation between the sense amplifier and the bit line, whereby current passing through the sense amplifier to the sense nodes is enabled to charge the bit line capacitance through the isolating apparatus to predetermined logic voltage level.
REFERENCES:
patent: 4780850 (1988-10-01), Miyamoto et al.
patent: 4803663 (1989-02-01), Miyamoto et al.
patent: 4833654 (1989-05-01), Suwa et al.
patent: 4941128 (1990-07-01), Wada et al.
patent: 4943960 (1990-07-01), Komatsu et al.
patent: 4991142 (1991-02-01), Wang
patent: 5020031 (1991-05-01), Miyatake
Foss Richard C.
Gillingham Peter B.
Harland Robert
Mitsuhashi Masami
Wada Atsushi
Dinh Tan
Epps Georgia Y.
Mosaid Technologies Incorporated
LandOfFree
Dynamic random access memory using imperfect isolating transisto does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic random access memory using imperfect isolating transisto, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic random access memory using imperfect isolating transisto will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1711020