Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-04-24
2007-04-24
Le, Thao X. (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S275000, C438S238000, C438S210000, C438S258000, C257S903000, C257S904000, C257SE21661, C257SE27098
Reexamination Certificate
active
10662609
ABSTRACT:
Semiconductor devices having a dual polysilicon electrode and a method of manufacturing are provided. The semiconductor devices include a first polysilicon layer deposited on a second polysilicon layer. Each polysilicon layer may be doped individually. The method also allows for some semiconductor devices on a wafer to have a single polysilicon wafer and other devices to have a dual polysilicon layer. In one embodiment, the semiconductor devices are utilized to form a memory device wherein the storage capacitors and transistors located in the cell region are formed with a dual polysilicon layer and devices in the periphery region are formed with a single polysilicon layer.
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Chiang Min-Hsiung
Pai Chih-Yang
Wang Chen-Jong
Wuu Shou-Gwo
Le Thao X.
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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