Driver IC and inspection method for driver IC and output device

Details Driver IC and inspection method for driver IC and output device Driver IC and inspection method for driver IC and output device

2007-08-14

2007-08-14

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S719000

Reexamination Certificate

active

11020001

ABSTRACT:
A driver IC including: a plurality of output pads; and a plurality of signal switch circuits, each of the signal circuits being provided on one of signal paths respectively connected to the output pads, wherein each of the signal switch circuits switches between a first state (or a use state) in which a signal from an upstream side of the signal path is allowed to pass through the signal switch circuit and a second state (or an inspection state) in which a level pattern of signals from the output pads is fixed to an inspection level pattern, according to a control signal.

REFERENCES:
patent: 2002/0158832 (2002-10-01), Park et al.
patent: 2003/0028836 (2003-02-01), Maeda et al.
patent: 2005/0035805 (2005-02-01), Tanada
patent: 06-186279 (1994-07-01), None
patent: 10/213616 (1998-08-01), None
patent: 2000-055988 (2000-02-01), None

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