Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-04-29
2008-04-29
Whitehead Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S455000, C438S458000, C438S459000, C438S479000
Reexamination Certificate
active
07364974
ABSTRACT:
A method of fabricating a double gate FET on a silicon substrate includes the steps of sequentially epitaxially growing a lower gate layer of crystalline rare earth silicide material on the substrate, a lower gate insulating layer of crystalline rare earth insulating material, an active layer of crystalline semiconductor material, an upper gate insulating layer of crystalline rare earth insulating material, and an upper gate layer of crystalline rare earth conductive material. The upper gate layer and the upper gate electrically insulating layer are etched and a contact is deposited on the upper gate layer to define an upper gate structure. An impurity is implanted into the lower gate layer to define a lower gate area aligned with the upper gate structure. A source and drain are formed in the active layer and contacts are deposited on the source and drain, respectively.
REFERENCES:
patent: 2002/0014646 (2002-02-01), Tsu et al.
patent: 11233732 (1999-08-01), None
Goltry Michael W.
Jr. Carl Whitehead
McCall-Shepard Sonya D.
Parsons Robert A.
Parsons & Goltry
LandOfFree
Double gate FET and fabrication process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Double gate FET and fabrication process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double gate FET and fabrication process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2765260